IVA 110-s Internal Vapor Analyzer

Perform Package Moisture and Gas Analysis…. On-Site at Your Facility. Introducing a user-friendly test system for monitoring the quality of your hermetic packaging processes. IVA™ Technology was invented by ORS and offers the most accurate and reproducible data in the industry.

The Internal Vapor Analyzer system is specifically designed for the quantitative analysis of low molecular weight gases contained in hermetic packages, cavities and other enclosures. The Model 110-s concept integrates automated hardware with easy-to-use icon-driven software. Its design permits routine quality control, failure analysis and research level testing operation as a turn-key analytical system.

The IVA™ 110-s includes a high-performance, quadrupole-mass spectrometer analyzer, a sample-mounting interface and precision hardware. The instrument is also computer-controlled and equipped with exclusive ORS integrated system control software- which provides instrument control, data analysis, data archiving and ease of operation.

Why you should understand the Test Method & Specification of Krypton 85?

The Krypton-85 Leak Testing method is a highly sensitive technique used to measure fine and gross leak rates in high reliability devices. It is the preferred method to characterize small leak rates in critical military components.

The technique was developed in the 1950’s and is still in use today for evaluating military hybrids, commercial sensors, medical implants, silicon based MEMS packaging applications and many others.

The advantages of Krypton 85 over other methods include extremely fast test times, lower overall testing cost, lower leak rate detection (<10-12 atm cc/sec Air limits), minimal absorption to glasses, leak site(s) identification and the ability to test in ambient conditions.

Description of Test Procedure:
The device is placed into a specialized test chamber and pressurized with a gas mixture of air and small amounts of Krypton-85 gas. The mixture will then enter the package cavity if a leak is present. The Krypton-85 leak rate equation determines the pressure and duration of the test based on a reject leak rate value. The client only needs to determine the reject leak rate (Qs) value for the package under test.

The Krypton-85 equation is defined as:
Qs =           R          
        (S)(K)(P)(T)(t)

Where:
Qs = reject leak rate (atm cc/ sec Kr)
R = detector reject level (cpm)
S = specific activity (uCi/atm cc)
K = counting efficiency (cpm/uCi)
P = (Pe2 – Pi2)
       Pe2 = external bomb pressure (atm)
         Pi2 = internal pressure of part (atm)
T = bomb time (hours)
t = 3600 (sec/hr)

After the pressurization cycle, the packages are typically screened using an X-ray scintillation crystal. The crystal is capable of detecting up to 15,000 cpm/uCi of residual Krypton-85. This type of ultra-sensitive detection capability allows for the measurement of extremely small quantities of Krypton-85 gas that may have entered the package.

Various crystal geometries are available but two types are the most common. A flat crystal and/or a well type crystal are commonly utilized depending on the package size and quantity being tested.

The net X-ray count rate measured is proportional to the total Krypton-85 content within the package. The count rate measured is the actual detection of the disintegration rate of Krypton-85 molecules. Each Krypton-85 molecule emits a 0.51 MeV Gamma ray. The total number of molecules that entered the package can also be calculated and hence the total leak rate of the package. In addition, the detection process is performed at ambient conditions and thus the packages are not exposed to vacuum. Testing at ambient conditions mitigates or eliminates the problems encountered with helium based leak testing.

Gross leaks can also be measured using a small directional counter (Geiger Müller tube) that detects the 0.69 MeV Beta particles. This system can be used to pin point the exit site of the gas from the package.

Test Methods:
° Mil-Std 750 method 1071 condition G1, G2
° Mil-Std 883 method 1014 condition B1, B2

Specifications:
° Radioisotope: Krypton-85 gas
° Pressurization range. 30-120 psia
° Minimum detection limit: <1X10-12 atm cc/sec Air
° Accuracy: +/- 10% of value.
° Measurement method: Batch Testing or Read and Record

About us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:   (315) 736-5480      
Fax: (315) 736-9321

For further information
please contact:
Deborah Delluomo
Phone :( 315) 736-5480       ext. 2202

http://www.orslabs.com

Why Surface Analysis is important?

home

Surface Analysis Techniques:

Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.

Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth.

http://www.phi.com/images/products/versaprobe/body-image.jpg

Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)

About Author:

ORS Labs offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganics. Our scientific staff will recommend the analytical technique that will best meet your requirements.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo)
Fax: (315) 736-9321

http://www.orslabs.com

Why does u need Analytical Testing Services?

home

MATERIALS AND COMPONENT SERVICES OVERVIEW

ORS offers a variety of analytical services to assist you in the Quality Control, Process Monitoring, Failure Investigation or Research & Development of your products. Our goal is to provide you with analytical tools to aid in maintaining and improving the quality of your products.

Testing Services for the Microelectronic Industry
A comprehensive suite of tests evaluating the quality and integrity of microelectronic components and manufacturing practices.

Internal Vapor Analysis (IVA™)
Internal Vapor Analysis (IVA™) is a versatile and precise test procedure developed at ORS for the Residual Gas Analysis (RGA) of hermetic packages. The IVA™ method utilizes advanced Mass Spectrometry techniques to accurately determine the relative concentrations of gas or vapor content in hermetic devices, modules, packages, and inclusions.

Internal Vapor Analysis (IVA™) may now be performed by Gas Chromatography with Mass Spectrometry (GC/MS) to identify unknown volatile and semi-volatile organics in hermetic devices, modules, and packages. ORS has developed a procedure to determine relative concentrations of gases in these packages using a modified GC sample inlet designed at ORS. The GC/MS procedure allows positive identification of unknown organics not traditionally identified during RGA analysis. This procedure is an excellent complement to RGA for a “complete picture” of internal vapors.

Hermeticity Testing
ORS offers two types of non-destructive hermeticity testing. Test methods are designed to determine the quality of a hermetic seal. Fine leak rates are quantified using a helium mass spectrometer or a Kr85 Scintillation Detector. Gross leak rates are characterized by perflourocarbons, dye pentrants or devices failing the initial Kr85 gross leak pressurization. Specialized testing capabilities to measure the leak rate of various other gases or compounds (i.e. Argon, Acetic Acid, etc.) are also available.

Materials Outgassing Studies
The Material Outgassing Characterization test, developed at ORS, is a qualitative and quantitative analysis of the off-gassed gaseous substances desorbed from bulk materials. Outgassing studies may be useful in determining hydrogen desorption rates, adhesive outgassing species (pre and post cure), and to characterize other organic bulk materials used in high reliability components, including polymers, coatings, and epoxies. This method can even be modified to identify organic contamination on materials.

Organic Mass Spectrometry
Numerous techniques are available to identify volatile and semi-volatile organic compounds, and impurities from a variety of sample matrices. Sensitivity in the ppb range is commonly obtained. A useful technique to identify low level "unknown" organic compounds in IVA™ data.

Construction Analysis
Typically performed on microelectronic devices to determine or evaluate the inherent design and robustness of a component by examining its physical characteristics and quality of workmanship.

Destructive Physical Analysis
Disassembly, testing and inspection of microelectronic devices to determine conformance with applicable design, process and procurement requirements.

Failure Analysis
A comprehensive examination of failed devices or components to verify a reported failure mode, identify the failure mechanism, and recommend corrective actions.

About Us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, Tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo) 

Fax: (315) 736-9321
http://www.orslabs.com

Importance & Uses of Residual gas analyzer & Test methods

 

home

 

RGA has been designed to observe contamination in vacuum process. It also controls process. They are used to detect contaminants in low pressure atmosphere of gas. They are also used to determine quality of the vacuum. They are found in those applications that are of high vacuum such as accelerators, surface science set ups and in research compartments. The most easily available kind of this tool is open ion source, but the closed ion source is also available.

Applications apply to a wide range of industries including Microelectronics, Large Hermetic Modules, Metals, Ceramics, Telecommunications, Food, Medical Devices, Pharmaceutical, Packaging and Illumination.

The gas content inside sealed components, particularly moisture concentration, can cause long term reliability problems such as corrosion, fogging, leakage, current bit errors and lubrication issues. Known to some as Residual Gas Analysis (RGA) or "Mil-Std 1018", the test measures the primary sealing gases and trace gases. It is ideally suited for process development, sealing quality control, studying long term out-gassing of the enclosed materials inside the components, and for product qualification.

Both systems were designed and manufactured by ORS. Please view our IVA™ Instrument Sales web page for more information on acquiring this technology for use in your facility.

In parallel with Internal Vapor Analysis, ORS offers additional analytical techniques for the Qualification and process development of polymers, epoxies, coatings, and adhesives used in passive or active components. Outgassing of solvents, extenders, or reaction by-products and their deposition on critical surfaces can be a reliability concern. Residual outgassing products can be monitored and quantified by the following methods: Internal Vapor Analysis, Static headspace analysis by GC/MS, and ampoule analysis.

Test Methods

MEL-1053: Internal Vapor Analysis - Commercial Practice

 This test procedure is used for testing hermetic devices in accordance with ORS’ Commercial Practice for Internal Vapor Analysis .This test method extends the scope and capabilities of traditional Mil-Std-883 or 750, method 1018 analysis. It permits variations to the procedure and/or device test conditions to achieve the best test conditions for specific client applications. Client specific protocols may be established for maximum accuracy and sensitivity for product monitoring applications, process development, R&D, materials evaluations and failure analysis projects. The data is not subject to inclusion in the annual retention report to DLA and all records regarding these tests are confidential.

MEL-1018: Internal Water Vapor Content - DLA Suitability for Military Devices

This test procedure is used exclusively for testing hermetic devices in accordance with Mil-Std-883 or 750, method 1018, procedure 1 per the conditions of “Suitability” status granted by DLA Land and Maritime (DLA). No variations are permitted to this procedure or to the device test conditions. Furthermore, all tests performed per this procedure are subject to inclusion in the annual retention report to DLA and all records regarding these tests are subject to audit and inspection by the U.S. Government.

Including Observations on the Outgassing Characteristics of Materials:

Using the 22 to 1 oxygen/argon ratio, we can determine that the oxygen content has also decreased from an expected 20.3% to a reported 15.6%. In this particular case, it was determined that a new lot of ceramic lids had a hydrocarbon residue that was thermally degrading during the sealing process, consuming oxygen and generating carbon dioxide and moisture in the process. The contaminant may have been from the manufacturing operation (e.g., a mold release agent) or from the packaging used in ship-ping (e.g., a residual plasticizer). The device manufacturer's usual cleaning process was insufficient to remove the contaminant.

About Us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, Tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo)
Fax: (315) 736-9321

http://www.orslabs.com

 

 

Use Surface Analysis Techniques in your Laboratory by ORS

home

 

ORS offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganic. Our scientific staff will recommend the analytical technique that will best meet your requirements.

 

Surface Analysis Techniques:

Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.

Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth.

Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (
SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)

Importance of Surface analysis:

Ors1

Analyzing how the surface of a product will behave is very essential as areas of various elements are totally interwoven into many aspects of our everyday life. Based on the behavior of the top region, different components can be used for different purposes and products. So you should have details about content areas. These details can be collected using the technique of surface analysis.

To be able to comprehend the qualities and reactivity of any area it is necessary to comprehend its physical terrain, material design, nuclear and substance framework, the electronic condition, and the way in which the surface substances connection with each other. Different methods of area research have been designed to evaluate and comprehend these different features of surface.

While it is not necessary to comprehend all of these features for individual programs, having a essence about them always helps improve the quality of products and programs. To be able to get specific information about the area, it is necessary to somehow intervene with its condition in some way. This could be in the form of junk mail the top area with electrons, photons or ions.

While the bombardment is not significant, it does have an impact on the physical and substance qualities of the top region. However, by managing the surroundings in which this bombardment is performed, it is possible to control the changes that take place in the top spot. This atmosphere is best designed through the use of contemporary research gadgets known as surface analyzers. Another name given to these analyzers is profilometers as they help make finish information of the surface of any materials.

Majority of spot analyzers contain a stylus pen that has a signal at its tip. This signal choice up area problems and features and transforms these into user understandable format. In the simplest of terms, a spot analyzer is a device that decides quality of a region by assessing and increasing the current changes that take place when a sensitive stylus pen is moved over it. The current generated from such movement is fed into an indication that magnifies it up to 50,000 times to create a accurate and detailed map of the area under analysis.

 

About Us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

 

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:   (315) 736-5480 ext. 2202   (Deborah Delluomo)
Fax: (315) 736-9321

http://www.orslabs.com

 

 

 

XRF analysis testing services

 

home

X-Ray Fluorescence is an analytical technique used to perform elemental identification of materials. This technique is similar to Scanning Electron Microscopy/Energy Dispersive X-Ray Analysis (SEM/EDX), which is also used to perform elemental analysis. XRF is preferred for ease of use and for non-conductive material applications such as plastics, ceramics, glasses, and liquids. 

Information Obtained and Applications 

° Qualitative Bulk Analysis - Solders, metals, jewlery, plastics, ceramics, 
   powders and liquids

° Film or plating Analysis – Composition and thickness of PCB/PWB metallization
   schemes Au/Ni/Cu

° Quantification of elemental composition including phosphorous content in Nickel

° Identify anomalies/defects and possible causes

° RoHS and prohibitive materials mitigation 

Instrument Sensitivity/Capabilities 

° SEA 5120 Ultra Thin Window Si(Li) Detector 

° Qualitative/Quantitative analysis of microscopic objects (100µm level)

° Detection and identification of elements C -> U

° A video display and frame capture capabilities of sample

° Three collimators: 4-mil, 80-mil, and 80-mil with a Mo filter

° Tube voltage from 15, 45 or 50kV

° Elemental analysis and thick measurements of multiple layers

° Sample size 80mm(W) x 80mm(D) x 35mm(H). Max weight 3kg 

 

These days though, with the great progress in technical developments, there are methods to get cause examining done quick and even reasonably. XRF examining is not only incredibly quick, but incredibly precise. With this technique, there's no lab examining engaged. It's a issue of a bit of area work.

XRF appears for X-Ray Fluorescence. It's caused by what happens to an item when it has been revealed to great power X-rays, or what are known as gamma light. It is the trend that happens as greater experience light outcomes in the re-emission of reduced light.

XRF examining is a regularly used strategy to evaluate substance research. It is of particular use on materials, and is perfect for examining cause. Not only can it be done without getting huge examples, but it's relatively effortless.

XRF is quick, especially when as opposed to difficult process of getting a example to a lab for research. In most conditions it can be finished in as little as two minutes. In some conditions, such as in exams for 'abnormal' amounts or find outcomes, it can take up to 10 minutes. It's a issue of performance with regards to the person conditions of the situation. The price of such a process is about similar to that of lab choosing including a transformation of two several weeks.

With XRF, two several weeks gets two minutes. And XRF examining is less obtrusive. Since much lesser examples are needed, it reduces the need of the often dangerous volumes taken for clinical techniques. Only the infected area will need eliminating. And with the on-the-job techniques, the individual who expected the analysis will be right there to information and perform with the analysis professional to prevent needless actions.

There are usually two methods to bring out good content examination and these are x-ray fluorescence and ignite exhaust spectrography. X-ray fluorescence (XRF) is usually more efficient than ignite exhaust spectrography because it results in no records on the top area of the content being examined. The x-ray flourescence devices includes radioactive resources that produce low current x-rays. As the concept talks, atoms of components revealed to x-rays become thrilled and produce power. The power produced by an thrilled atom is exclusive. Consequently, this technique is an efficient way of determining what components are existing in a content. X-ray flourescence does not only identify what components are existing but also decides how much of each factor is existing.

Much of good content recognition analyze is done with the use of x-ray flourescence, which is appropriate when the reliability of the content being examined should be maintained. Some content research need getting a item of the analyze topic for clinical research but this is not appropriate in many circumstances. Positive content recognition is just one of the many nondestructive examining techniques, like sound exhaust, flow recognition, and hydrotesting.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:   (315) 736-5480      
Fax: (315) 736-9321

For further information,

please contact:

Deborah Delluomo

Phone:            (315) 736-5480       ext. 2202

http://www.orslabs.com