orslabs's Space http://orslabs.posterous.com Most recent posts at orslabs's Space posterous.com Thu, 18 Apr 2013 03:06:00 -0700 Headspace Analysis For Perfect Results http://orslabs.posterous.com/headspace-analysis-for-perfect-results http://orslabs.posterous.com/headspace-analysis-for-perfect-results

In elemental analysis equipment, the term purge and trap refers to a kind of autosampler inlet that makes use of a mechanism to introduce the sample. Often used for gas chromatography, inlets that feature purge and trap expertise have the ability to detect compounds at low parts per billion levels. Headspace analysis involves checking the content for any impurities. The hermatic samples are analyzed for primary and trace gases. The method is used across range of industries like microelectronics, pharmaceutical industries, telecommunications and medical devices etc. It is ensured that there are no prohibited materials in the sample. In case of problems, there could be problems like moisture, corrosion and current bit errors etc. Thus, they are the preferred type of inlet for testing for volatile organic compounds, hazardous gases that usually vaporize at room temperature.

A purge and trap autosampler is an improvement on autosamplers that require the sample to be injected by hand. In addition to preserving the integrity of the sample, purge and trap mechanisms also help to protect the tester and streamline the gas chromatography system. In the event you are thinking about investing in an autosampler, but you require to have some questions answered before you do, you need to conduct a thorough checking of the ingredients. Laboratory equipment can be a significant investment. But getting the right equipment can make a difference in the quality of a lab's work. Before you invest in an autosampler, consult with a professional seller of elemental analysis equipment, and ask about the choice of buying lab equipment used.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Mon, 18 Mar 2013 02:30:00 -0700 Microelectronic Industry And Analytical Testing Services http://orslabs.posterous.com/microelectronic-industry-and-analytical-testi http://orslabs.posterous.com/microelectronic-industry-and-analytical-testi

In present scenario, where computers, electronics and various optical devices including light-emitting diodes, lasers and solar panels are already developed sectors and most significant areas of technology, the microelectronic market is also growing at a very fast pace. With the boom in this market, the need for highly functional microelectronic products is increasing rapidly. This increasing demand of these products has ultimately augmented their production which eventually raised the requirement of analytical testing services for these products.

Manufacturing of microelectronic products is not an easy task and hence their fabrication involves complex procedure including superior quality material, sophisticated tools and equipment, quality testing and other related steps. The microelectronic industry is dealing with a discouraging task of managing and co-integrating an unparalleled convergence of pioneering approaches. As a result of the introduction of these pioneering approaches and new material created a new set of diverse and simultaneous difficulties for both, unit process development and process assimilation.

Testing services for microeconomic components involves a thorough check on each and every stage of production and well as its practices. This not only involves manufacturing testing but, material testing is the other major aspect which is tested while producing these components. Various tools and equipments are widely used for advanced measuring instrumental analysis which can work at smaller metrics to control quality of the components in a better way. Electron Microscopy is among such important tools which are used for testing these components.

Electron Microscopy system of testing is widely used to test the characteristics of micro and nano component features. Various material related problems come across during research and development including production engineering, reliability testing for failure analysis and engineering can be easily solved by using Electron Microscopy. There are two types of essential electron microscopy methods which are used for testing material for microelectronic products i.e. Transmission Electron Microscopy and Scanning Electron Microscopy (SEM).

If you are also looking for analytical testing services, then you can find them online. There are a huge number of companies offering these services. All you need to do is to type a related keyword in any popular search engine, then you will get all the best results displayed before you among which you can choose the one that fits all your needs. Some prominent testing companies are expert in various testing tasks including construction analysis, chemical analysis, destructive physical analysis, failure analysis, Scanning Acoustic Microscopy and Real Time X-Ray Inspection.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 06 Feb 2013 22:27:00 -0800 Secured Natural Gas for Safe Use http://orslabs.posterous.com/secured-natural-gas-for-safe-use http://orslabs.posterous.com/secured-natural-gas-for-safe-use

Residual gas analyzers are crucial for the oil and natural gas industry. It plays the key role for analyzing oil and natural gas. The RGA testing equipments are used to ensure moisture-free machines in the industry. Different tests are conducted under the checking process to analyze gas properties. Tests are conducted in high-tech laboratories under stringent conditions. These labs are equipped with state-of-the-art technology and use the latest techniques for analyzing gas contents. The gas also goes through high quality lab testing for ensuring appropriate proportion of component gases. All this is necessary for ensuring safety and security of equipments.

High quality of gas analysis is needed for ensuring safety and security in defense, the aerospace industry, microelectronics, telecom and medical equipments. In these crucial industries, extremely pure form of gas is needed, so they must go through strict analysis and filtering process. The purity should be high as these involve human lives under critical conditions. Moreover, these are high-priority uses and involve millions of dollars such as in the aerospace industry. A little malfunction in the gas analysis process means tremendous loss of resources and advanced equipments, gadgets and devices.

Highly qualified and experienced personnel work in the testing of the natural gas for making sure that the final product is of the finest quality. The skilled personnel at the research facilities and labs perform tests to ensure that these work properly in real life conditions. There are a number of tests and services like IVA which is performed under standard laboratory and conditioned areas. It is used for maintaining high quality materials. IVA or the Internal Vapor Analysis, vapor is analyzed for components. Both primary and the residual components are assessed for quality and quantity. For this, hermetic components are analyzed for both primary gases as well as trace gases. The tests are conducted to make sure that the gas as well as moisture components are in good condition. Checks are conducted under strict laboratory conditions for any leakage and lubrication. These are mandatory for making sure that it is used safely. Further checks are performed for corrosion etc. which ultimately prepare secure conditions. In case of moisture, de moisturization is performed for security of the crucial components. These are used in range of industries like, the ceramics industry, the pharmaceutical industry, medical devices, food and beverage industry, illumination and even the ceramic industry. The residual analysis plays a crucial role for a range of industries on which human lives depend.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Tue, 08 Jan 2013 01:48:00 -0800 RGA analysis services for moisture-free parts http://orslabs.posterous.com/rga-analysis-services-for-moisture-free-parts http://orslabs.posterous.com/rga-analysis-services-for-moisture-free-parts

RGA analysis services for moisture-free parts Body: Gas analysis is one of the main aspects of the oil and natural gas industry. There are laboratory tests to check the gas for different properties. That is why residual gas analysis and services is performed. There are laboratories, which are equipped with the latest devices and equipment to ensure high quality of gas. The labs are also equipped with state-of-the-art technology to ensure high quality fuel for various industries. The RGA analysis and services ensure security and safety of equipments.

Some industries where gas analysis is must include the aerospace industry, microelectronics, defense, medical and telecommunication. High level of quality should be ensured for products manufactured in these industries. High level of quality control is required for these products to function properly. There is high quality research and development services in this laboratories. High level of analytical services is provided by these residual gas analysis experts. There are number of services like IVA or Internal Vapor Analysis services, which ensure high quality of the material. Under vapor analysis, the hermetic components are analyzed for primary and trace gases quantity. The gas component and the moisture amount in the sealed components are thoroughly checked for leakage, corrosion, lubrication, and fogging etc. it is required for checking moisture amount for long-term protection of components. The equipment components are checked for moisture or vapor amounts. The de-moisturizing of the components ensures a secured product for long term.

The industries, which use these technologies, include medical devices, large hermetic modules, food industry, ceramics, illumination, metals and pharmaceutical industries. These industries use moisture-free component parts and it is must have totally moisture free component to avoid crack, leak, corrosion and any other harmful effects or damage. High quality equipments and techniques are used for vapor analysis in laboratories. The laboratory conditions are of international standards. The equipments, devices, gadgets, apparatus and all other components are made totally moisture free. Moreover, the equipments are checked thoroughly for any issues. Research and development is carried out at the laboratories to ensure maintaining the product at international standards. The stringent laboratory conditions ensure no amount of moisture in the components.

These tests are researched and conducted by highly skilled personnel. They are experts in the de-humidifying components. There are highly qualified and skilled experts who ensure that standard of the highest level are maintained. These highly skilled personnel and experienced personnel are involved in this. The combined skills of highly knowledgeable persons and fresh talents ensure high quality component function.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 05 Dec 2012 20:28:00 -0800 Analytical Testing Services: For Quality Control Purposes http://orslabs.posterous.com/analytical-testing-services-for-quality-contr http://orslabs.posterous.com/analytical-testing-services-for-quality-contr

We provide specialized laboratory testing services and focus on research, developments and quality control. We ensure that purity is maintained and provide these services to different sectors like telecommunications, aerospace, microelectronics, aerospace and defense industries. There are a number of analytical testing services that we provide. Few testing techniques that are explained are Hermeticity testing, Material Outgassing Characterization, Organic mass spectometry, Construction analysis, Destructive physical analysis, failure analysis, Scanning accoustic microscopy and Real-time X-ray inspection.

Hermeticity testing is a technique used to detect atmosphere leakages in a hermetic package. A hermetic seal refers to the container being airtight. Lack of hermeticity results in leakages referring to the free movement of moisture and other contaminants. The amount of leakages tells you the scale of hermeticity failure of the package. This type of testing is crucial for space, military and commercial hermetically sealed devices. The Material Outgassing Characterization test developed by us is a quantitative and qualitative analysis of gaseous substances desorbed from bulk materials after thermal stress. You can modify this method to identify organic contamination on materials. Our organic mass spectometry department identifies volatile and semi-volatile organic compounds and impurities. We provide method development and mass spectometry testing services to a variety of industries.

Construction Analysis is performed on microelectronic devices to determine or evaluate the inherent design and robustness of a component by examining its physical characteristics and quality of workmanship. With Destructive physical analysis you disassemble, test and inspect a component to determine conformance with applicable design and process requirements. This analytical testing service ensures that a high reliability device is fabricated in accordance to the required standards. It can be effectively used to determine process defects in production. In Failure Analysis we will examine failed devices or components to identify the failure mechanism and recommend corrective actions. Real time X-Ray Inspection measures complex structures of varying densities. X-ray technology helps eliminate food product contamination. Inspection is performed while moving, rotating, and tilting the sample with sub-micron defect recognition. Traditional high resolution film x-ray are also available. Scanning accoustic microscopy is a failure analysis technique and is used to detect voids, delaminations and other anomalies. Multiple measurement modes include B-Scan, C-Scan and Through-Scan.

We thoroughly inspect the package to identify leakages and their causes. Our main aim remains that we provide you with analytical tools to assist and help you maintain the quality of your products.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Thu, 08 Nov 2012 02:48:00 -0800 Avoid contamination with Analytical testing services http://orslabs.posterous.com/avoid-contamination-with-analytical-testing-s http://orslabs.posterous.com/avoid-contamination-with-analytical-testing-s

Is your package getting contaminated in some way? Contamination can be due to many reasons. We provide you with a variety of testing services like Gas analysis, Component analysis, Analytical services as well as Consulting services. This way, you can gain information on how and from where contamination was possible.

GAS analysis comprises of Internal Vapor Analysis(IVA), High Resolution IVA (HR-IVA), Hermeticity testing, Krypton-85 leak testing, Material outpassing studies, IVA instrument sales and Organic mass spectrometry.

Internal vapor analysis refers to gas analysis by mass spectrometry. With IVA services you can trace the internal gas composition of hermetic and air-tight devices. Identify the gas content inside as they may cause problems such as corrosion, fogging, leakage as well as other issues that cause moisture content inside the container. This can create discrepancies and shifts in the manufacturing process. Residual gas analysis helps to control processes by monitoring contamination in vacuum systems. You can test primary sealing gases and trace gases. Residual gas analyzer monitors the quality of vacuum and help to detect minute traces of impurities.

High resolution IVA analyzer is used to test cavity gases in very small-volume packages. We have newly developed this technology. It can be useful to all those companies who supply products in small packages. This technology provides great sensitivity to package volumes.

With Hermeticity testing, you can determine the effectiveness of the seal in your packages. This is an obligation you have to fulfill for military, space and other commercial industries. If your seal is damaged, moisture and other contaminants can enter the package, degrading the long-term reliability.

For more information please visit us at http://www.zimbio.com/Iva+Obradovic/articles/7GRH8YaDj5h/Avoid+contamination+Analytical+testing+services

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Thu, 06 Sep 2012 02:42:00 -0700 Gas Analysis Test Methods Used by ORS-LABS http://orslabs.posterous.com/gas-analysis-test-methods-used-by-ors-labs http://orslabs.posterous.com/gas-analysis-test-methods-used-by-ors-labs

Description Of Test Methods

SOP MEL-1053: Internal Vapor Analysis – Commercial Practice

This test procedure is used for testing hermetic devices in accordance with ORS’ Commercial Practice for Internal Vapor Analysis. This test method extends the scope and capabilities of traditional Mil-Std 883, Test Method 1018 analysis. It permits variations to the procedure and/or device test conditions to achieve the best test conditions for specific client applications. Client specific protocols may be established for maximum accuracy and sensitivity for product monitoring applications, process development, R&D, materials evaluations and Failure Analysis projects. The data is not subject to inclusion in the annual retention report to DLA Land and Maritime and all records regarding these tests are confidential. Contact ORS for a copy of this extended test method.

SOP MEL-1018: DLA Land and Maritime Suitability for Military Devices – Internal Gas Analysis

This test procedure is used exclusively for testing hermetic devices in accordance with Mil-Std 883 or 750, Test Method 1018, Procedure 1 per the conditions of “Suitability” status granted by DLA Land and Maritime. No variations are permitted to this procedure or to the device test conditions. Furthermore, all tests performed per this procedure are subject to inclusion in the annual retention report to DLA Land and Maritime and all records regarding these tests are subject to audit and inspection by the U.S. Government. Suitability range: 0.001cc to infinite volume.

IVA: Internal Vapor Analysis utilizing a Quadrupole Mass Spectrometer for sample volumes greater than 0.01cc.

HR-IVA: High Resolution Internal Vapor Analysis utilizing a custom compact Time-of-Flight (TOF) Mass

Spectrometer designed specifically for sample volumes less than 0.01cc and/or vacuum sealed devices.

SOP MEL-1070: Gas Cylinder Analysis of Sealing Chamber Atmospheres

This test method quantitatively measures the process sealing gases sampled from sealing chambers and/or gas supply lines using a specially prepared sampling cylinder. Sampling procedures are described in the instructions provided with the sampling cylinders. Contact ORS for availability and retail sampling cylinders.

SOP MEL-1080: Identification of Unknown Volatile Organic Compounds by IVA/GC/MS

This test method is used to identify unknown volatile compounds that may be detected in IVA test methods (identified as UNKNOWN compound(s)) but may not be conclusively identified due to the complexity or trace quantity of the mass spectra. The method uses IVA inlet technology interfaced with GC/MS. Standard hermetic devices or individual materials sealed in gas ampules may be analyzed. The technique is useful in understanding the chemical processes of material out gassing and chemical reactions from environmental stress.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Thu, 06 Sep 2012 00:20:00 -0700 DPA-Destructive Physical Analysis http://orslabs.posterous.com/dpa-destructive-physical-analysis http://orslabs.posterous.com/dpa-destructive-physical-analysis

Destructive Physical Analysis (DPA) verifies and documents the quality of device processing steps to avoid defects that will adversely affect performance. By disassembling, testing and inspecting a device, a complete profile can be created to determine how well a device conforms to design and process requirements. A complete DPA program typically consists of a systematic and progressive series of environmental and mechanical tests. In some cases defects revealed in a device can result in rejection of an entire lot of devices.

° External Visual Inspection… to assess overall exterior quality and workmanship.

° Real Time X-Ray Inspection… to nondestructively detect internal defects.

° Particle Impact Noise Detection… to detect loose particles inside a device cavity.

° Hermeticity and Internal Vapor Analysis… to quantify package integrity and internal atmosphere. These test methods may be used to gauge the susceptibility of a device to moisture-related failures triggered by poor sealing processes or internal post-seal out gassing.

° Internal Visual Inspection via Optical Microscopy and Scanning Electron Microscopy (SEM)… to evaluate the quality of passivation, metallization and other die related components.

° Glassivation Layer Integrity… to assess the structural quality of deposited dielectric films over aluminum metalized devices.

° Bond Strength… to measure wire bond strengths and evaluate bond strength distributions.

° Die Shear Strength… to determine the integrity of materials and procedures used to attach die or surface mounted passive elements to package headers or other substrates.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 05 Sep 2012 22:25:00 -0700 Surface Analysis http://orslabs.posterous.com/surface-analysis http://orslabs.posterous.com/surface-analysis

ORS offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganics. Our scientific staff will recommend the analytical technique that will best meet your requirements.

Surface Analysis Techniques:
Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.

Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth.

Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 05 Sep 2012 04:28:00 -0700 Micro FT-IR Spectroscopy- ORS LABS http://orslabs.posterous.com/159112054 http://orslabs.posterous.com/159112054

home

Micro FT-IR Spectroscopy
Fourier transform infrared spectroscopy is a powerful analytical tool based on interferometery that compares the returned or transmitted light energy of the IR spectrum to the emitted source spectrum. The result of FT-IR is a spectrum of the infrared energy absorbed by the sample. Covalent bonding vibrational frequencies, such as asymeteric stretching and deformation stretching is determined by correlation to the wavelengths in the IR Spectrum.


Information Obtained
Interpretation of the spectral information provides identification of functional groups or covalent bonding information. Determination of particulate or stained regions of printed circuit boards for failure analysis is possible. Identification of organic coatings on metals, paper and other materials for construction analysis purposes is also a common application. Additionally, a comparison of variations in materials for process control can be provided.

Capabilities: 
° All Reflecting Objective (ARO) analysis.
° Diamond Attenuated Transmission Reflected (ATR) analysis.
° Infrared spectral range: 4000 to 650 wavenumbers (cm-1).
° 25 µm spot size demonstrated
° 3000 compound library - acquired on same model instrument.


Industries:
Electronics
Plastics
Aerospace


Applications:

Polymers
Coatings
Metals

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 05 Sep 2012 02:19:00 -0700 IVA 110-s Internal Vapor Analyzer http://orslabs.posterous.com/iva-110-s-internal-vapor-analyzer http://orslabs.posterous.com/iva-110-s-internal-vapor-analyzer

Perform Package Moisture and Gas Analysis…. On-Site at Your Facility. Introducing a user-friendly test system for monitoring the quality of your hermetic packaging processes. IVA™ Technology was invented by ORS and offers the most accurate and reproducible data in the industry.

The Internal Vapor Analyzer system is specifically designed for the quantitative analysis of low molecular weight gases contained in hermetic packages, cavities and other enclosures. The Model 110-s concept integrates automated hardware with easy-to-use icon-driven software. Its design permits routine quality control, failure analysis and research level testing operation as a turn-key analytical system.

The IVA™ 110-s includes a high-performance, quadrupole-mass spectrometer analyzer, a sample-mounting interface and precision hardware. The instrument is also computer-controlled and equipped with exclusive ORS integrated system control software- which provides instrument control, data analysis, data archiving and ease of operation.

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 29 Aug 2012 23:22:00 -0700 Why you should understand the Test Method & Specification of Krypton 85? http://orslabs.posterous.com/why-you-should-understand-the-test-method-spe http://orslabs.posterous.com/why-you-should-understand-the-test-method-spe

The Krypton-85 Leak Testing method is a highly sensitive technique used to measure fine and gross leak rates in high reliability devices. It is the preferred method to characterize small leak rates in critical military components.

The technique was developed in the 1950’s and is still in use today for evaluating military hybrids, commercial sensors, medical implants, silicon based MEMS packaging applications and many others.

The advantages of Krypton 85 over other methods include extremely fast test times, lower overall testing cost, lower leak rate detection (<10-12 atm cc/sec Air limits), minimal absorption to glasses, leak site(s) identification and the ability to test in ambient conditions.

Description of Test Procedure:
The device is placed into a specialized test chamber and pressurized with a gas mixture of air and small amounts of Krypton-85 gas. The mixture will then enter the package cavity if a leak is present. The Krypton-85 leak rate equation determines the pressure and duration of the test based on a reject leak rate value. The client only needs to determine the reject leak rate (Qs) value for the package under test.

The Krypton-85 equation is defined as:
Qs =           R          
        (S)(K)(P)(T)(t)

Where:
Qs = reject leak rate (atm cc/ sec Kr)
R = detector reject level (cpm)
S = specific activity (uCi/atm cc)
K = counting efficiency (cpm/uCi)
P = (Pe2 – Pi2)
       Pe2 = external bomb pressure (atm)
         Pi2 = internal pressure of part (atm)
T = bomb time (hours)
t = 3600 (sec/hr)

After the pressurization cycle, the packages are typically screened using an X-ray scintillation crystal. The crystal is capable of detecting up to 15,000 cpm/uCi of residual Krypton-85. This type of ultra-sensitive detection capability allows for the measurement of extremely small quantities of Krypton-85 gas that may have entered the package.

Various crystal geometries are available but two types are the most common. A flat crystal and/or a well type crystal are commonly utilized depending on the package size and quantity being tested.

The net X-ray count rate measured is proportional to the total Krypton-85 content within the package. The count rate measured is the actual detection of the disintegration rate of Krypton-85 molecules. Each Krypton-85 molecule emits a 0.51 MeV Gamma ray. The total number of molecules that entered the package can also be calculated and hence the total leak rate of the package. In addition, the detection process is performed at ambient conditions and thus the packages are not exposed to vacuum. Testing at ambient conditions mitigates or eliminates the problems encountered with helium based leak testing.

Gross leaks can also be measured using a small directional counter (Geiger Müller tube) that detects the 0.69 MeV Beta particles. This system can be used to pin point the exit site of the gas from the package.

Test Methods:
° Mil-Std 750 method 1071 condition G1, G2
° Mil-Std 883 method 1014 condition B1, B2

Specifications:
° Radioisotope: Krypton-85 gas
° Pressurization range. 30-120 psia
° Minimum detection limit: <1X10-12 atm cc/sec Air
° Accuracy: +/- 10% of value.
° Measurement method: Batch Testing or Read and Record

About us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:   (315) 736-5480      
Fax: (315) 736-9321

For further information
please contact:
Deborah Delluomo
Phone :( 315) 736-5480       ext. 2202

http://www.orslabs.com

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Mon, 13 Aug 2012 22:02:00 -0700 Why Surface Analysis is important? http://orslabs.posterous.com/why-surface-analysis-is-important http://orslabs.posterous.com/why-surface-analysis-is-important home

Surface Analysis Techniques:

Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.

Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth.

http://www.phi.com/images/products/versaprobe/body-image.jpg

Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)

About Author:

ORS Labs offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganics. Our scientific staff will recommend the analytical technique that will best meet your requirements.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo)
Fax: (315) 736-9321

http://www.orslabs.com

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Tue, 07 Aug 2012 02:16:00 -0700 Why does u need Analytical Testing Services? http://orslabs.posterous.com/why-does-u-need-analytical-testing-services http://orslabs.posterous.com/why-does-u-need-analytical-testing-services home

MATERIALS AND COMPONENT SERVICES OVERVIEW

ORS offers a variety of analytical services to assist you in the Quality Control, Process Monitoring, Failure Investigation or Research & Development of your products. Our goal is to provide you with analytical tools to aid in maintaining and improving the quality of your products.

Testing Services for the Microelectronic Industry
A comprehensive suite of tests evaluating the quality and integrity of microelectronic components and manufacturing practices.

Internal Vapor Analysis (IVA™)
Internal Vapor Analysis (IVA™) is a versatile and precise test procedure developed at ORS for the Residual Gas Analysis (RGA) of hermetic packages. The IVA™ method utilizes advanced Mass Spectrometry techniques to accurately determine the relative concentrations of gas or vapor content in hermetic devices, modules, packages, and inclusions.

Internal Vapor Analysis (IVA™) may now be performed by Gas Chromatography with Mass Spectrometry (GC/MS) to identify unknown volatile and semi-volatile organics in hermetic devices, modules, and packages. ORS has developed a procedure to determine relative concentrations of gases in these packages using a modified GC sample inlet designed at ORS. The GC/MS procedure allows positive identification of unknown organics not traditionally identified during RGA analysis. This procedure is an excellent complement to RGA for a “complete picture” of internal vapors.

Hermeticity Testing
ORS offers two types of non-destructive hermeticity testing. Test methods are designed to determine the quality of a hermetic seal. Fine leak rates are quantified using a helium mass spectrometer or a Kr85 Scintillation Detector. Gross leak rates are characterized by perflourocarbons, dye pentrants or devices failing the initial Kr85 gross leak pressurization. Specialized testing capabilities to measure the leak rate of various other gases or compounds (i.e. Argon, Acetic Acid, etc.) are also available.

Materials Outgassing Studies
The Material Outgassing Characterization test, developed at ORS, is a qualitative and quantitative analysis of the off-gassed gaseous substances desorbed from bulk materials. Outgassing studies may be useful in determining hydrogen desorption rates, adhesive outgassing species (pre and post cure), and to characterize other organic bulk materials used in high reliability components, including polymers, coatings, and epoxies. This method can even be modified to identify organic contamination on materials.

Organic Mass Spectrometry
Numerous techniques are available to identify volatile and semi-volatile organic compounds, and impurities from a variety of sample matrices. Sensitivity in the ppb range is commonly obtained. A useful technique to identify low level "unknown" organic compounds in IVA™ data.

Construction Analysis
Typically performed on microelectronic devices to determine or evaluate the inherent design and robustness of a component by examining its physical characteristics and quality of workmanship.

Destructive Physical Analysis
Disassembly, testing and inspection of microelectronic devices to determine conformance with applicable design, process and procurement requirements.

Failure Analysis
A comprehensive examination of failed devices or components to verify a reported failure mode, identify the failure mechanism, and recommend corrective actions.

About Us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, Tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo) 

Fax: (315) 736-9321
http://www.orslabs.com

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 01 Aug 2012 02:22:00 -0700 Importance & Uses of Residual gas analyzer & Test methods http://orslabs.posterous.com/importance-uses-of-residual-gas-analyzer-test http://orslabs.posterous.com/importance-uses-of-residual-gas-analyzer-test

 

home

 

RGA has been designed to observe contamination in vacuum process. It also controls process. They are used to detect contaminants in low pressure atmosphere of gas. They are also used to determine quality of the vacuum. They are found in those applications that are of high vacuum such as accelerators, surface science set ups and in research compartments. The most easily available kind of this tool is open ion source, but the closed ion source is also available.

Applications apply to a wide range of industries including Microelectronics, Large Hermetic Modules, Metals, Ceramics, Telecommunications, Food, Medical Devices, Pharmaceutical, Packaging and Illumination.

The gas content inside sealed components, particularly moisture concentration, can cause long term reliability problems such as corrosion, fogging, leakage, current bit errors and lubrication issues. Known to some as Residual Gas Analysis (RGA) or "Mil-Std 1018", the test measures the primary sealing gases and trace gases. It is ideally suited for process development, sealing quality control, studying long term out-gassing of the enclosed materials inside the components, and for product qualification.

Both systems were designed and manufactured by ORS. Please view our IVA™ Instrument Sales web page for more information on acquiring this technology for use in your facility.

In parallel with Internal Vapor Analysis, ORS offers additional analytical techniques for the Qualification and process development of polymers, epoxies, coatings, and adhesives used in passive or active components. Outgassing of solvents, extenders, or reaction by-products and their deposition on critical surfaces can be a reliability concern. Residual outgassing products can be monitored and quantified by the following methods: Internal Vapor Analysis, Static headspace analysis by GC/MS, and ampoule analysis.

Test Methods

MEL-1053: Internal Vapor Analysis - Commercial Practice

 This test procedure is used for testing hermetic devices in accordance with ORS’ Commercial Practice for Internal Vapor Analysis .This test method extends the scope and capabilities of traditional Mil-Std-883 or 750, method 1018 analysis. It permits variations to the procedure and/or device test conditions to achieve the best test conditions for specific client applications. Client specific protocols may be established for maximum accuracy and sensitivity for product monitoring applications, process development, R&D, materials evaluations and failure analysis projects. The data is not subject to inclusion in the annual retention report to DLA and all records regarding these tests are confidential.

MEL-1018: Internal Water Vapor Content - DLA Suitability for Military Devices

This test procedure is used exclusively for testing hermetic devices in accordance with Mil-Std-883 or 750, method 1018, procedure 1 per the conditions of “Suitability” status granted by DLA Land and Maritime (DLA). No variations are permitted to this procedure or to the device test conditions. Furthermore, all tests performed per this procedure are subject to inclusion in the annual retention report to DLA and all records regarding these tests are subject to audit and inspection by the U.S. Government.

Including Observations on the Outgassing Characteristics of Materials:

Using the 22 to 1 oxygen/argon ratio, we can determine that the oxygen content has also decreased from an expected 20.3% to a reported 15.6%. In this particular case, it was determined that a new lot of ceramic lids had a hydrocarbon residue that was thermally degrading during the sealing process, consuming oxygen and generating carbon dioxide and moisture in the process. The contaminant may have been from the manufacturing operation (e.g., a mold release agent) or from the packaging used in ship-ping (e.g., a residual plasticizer). The device manufacturer's usual cleaning process was insufficient to remove the contaminant.

About Us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, Tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo)
Fax: (315) 736-9321

http://www.orslabs.com

 

 

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Wed, 04 Jul 2012 03:18:00 -0700 Use Surface Analysis Techniques in your Laboratory by ORS http://orslabs.posterous.com/use-surface-analysis-techniques-in-your-labor http://orslabs.posterous.com/use-surface-analysis-techniques-in-your-labor

home

 

ORS offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganic. Our scientific staff will recommend the analytical technique that will best meet your requirements.

 

Surface Analysis Techniques:

Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.

Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth.

Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (
SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)

Importance of Surface analysis:

Ors1

Analyzing how the surface of a product will behave is very essential as areas of various elements are totally interwoven into many aspects of our everyday life. Based on the behavior of the top region, different components can be used for different purposes and products. So you should have details about content areas. These details can be collected using the technique of surface analysis.

To be able to comprehend the qualities and reactivity of any area it is necessary to comprehend its physical terrain, material design, nuclear and substance framework, the electronic condition, and the way in which the surface substances connection with each other. Different methods of area research have been designed to evaluate and comprehend these different features of surface.

While it is not necessary to comprehend all of these features for individual programs, having a essence about them always helps improve the quality of products and programs. To be able to get specific information about the area, it is necessary to somehow intervene with its condition in some way. This could be in the form of junk mail the top area with electrons, photons or ions.

While the bombardment is not significant, it does have an impact on the physical and substance qualities of the top region. However, by managing the surroundings in which this bombardment is performed, it is possible to control the changes that take place in the top spot. This atmosphere is best designed through the use of contemporary research gadgets known as surface analyzers. Another name given to these analyzers is profilometers as they help make finish information of the surface of any materials.

Majority of spot analyzers contain a stylus pen that has a signal at its tip. This signal choice up area problems and features and transforms these into user understandable format. In the simplest of terms, a spot analyzer is a device that decides quality of a region by assessing and increasing the current changes that take place when a sensitive stylus pen is moved over it. The current generated from such movement is fed into an indication that magnifies it up to 50,000 times to create a accurate and detailed map of the area under analysis.

 

About Us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

 

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:   (315) 736-5480 ext. 2202   (Deborah Delluomo)
Fax: (315) 736-9321

http://www.orslabs.com

 

 

 

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs
Tue, 03 Jul 2012 03:03:00 -0700 XRF analysis testing services http://orslabs.posterous.com/xrf-analysis-testing-services http://orslabs.posterous.com/xrf-analysis-testing-services

 

home

X-Ray Fluorescence is an analytical technique used to perform elemental identification of materials. This technique is similar to Scanning Electron Microscopy/Energy Dispersive X-Ray Analysis (SEM/EDX), which is also used to perform elemental analysis. XRF is preferred for ease of use and for non-conductive material applications such as plastics, ceramics, glasses, and liquids. 

Information Obtained and Applications 

° Qualitative Bulk Analysis - Solders, metals, jewlery, plastics, ceramics, 
   powders and liquids

° Film or plating Analysis – Composition and thickness of PCB/PWB metallization
   schemes Au/Ni/Cu

° Quantification of elemental composition including phosphorous content in Nickel

° Identify anomalies/defects and possible causes

° RoHS and prohibitive materials mitigation 

Instrument Sensitivity/Capabilities 

° SEA 5120 Ultra Thin Window Si(Li) Detector 

° Qualitative/Quantitative analysis of microscopic objects (100µm level)

° Detection and identification of elements C -> U

° A video display and frame capture capabilities of sample

° Three collimators: 4-mil, 80-mil, and 80-mil with a Mo filter

° Tube voltage from 15, 45 or 50kV

° Elemental analysis and thick measurements of multiple layers

° Sample size 80mm(W) x 80mm(D) x 35mm(H). Max weight 3kg 

 

These days though, with the great progress in technical developments, there are methods to get cause examining done quick and even reasonably. XRF examining is not only incredibly quick, but incredibly precise. With this technique, there's no lab examining engaged. It's a issue of a bit of area work.

XRF appears for X-Ray Fluorescence. It's caused by what happens to an item when it has been revealed to great power X-rays, or what are known as gamma light. It is the trend that happens as greater experience light outcomes in the re-emission of reduced light.

XRF examining is a regularly used strategy to evaluate substance research. It is of particular use on materials, and is perfect for examining cause. Not only can it be done without getting huge examples, but it's relatively effortless.

XRF is quick, especially when as opposed to difficult process of getting a example to a lab for research. In most conditions it can be finished in as little as two minutes. In some conditions, such as in exams for 'abnormal' amounts or find outcomes, it can take up to 10 minutes. It's a issue of performance with regards to the person conditions of the situation. The price of such a process is about similar to that of lab choosing including a transformation of two several weeks.

With XRF, two several weeks gets two minutes. And XRF examining is less obtrusive. Since much lesser examples are needed, it reduces the need of the often dangerous volumes taken for clinical techniques. Only the infected area will need eliminating. And with the on-the-job techniques, the individual who expected the analysis will be right there to information and perform with the analysis professional to prevent needless actions.

There are usually two methods to bring out good content examination and these are x-ray fluorescence and ignite exhaust spectrography. X-ray fluorescence (XRF) is usually more efficient than ignite exhaust spectrography because it results in no records on the top area of the content being examined. The x-ray flourescence devices includes radioactive resources that produce low current x-rays. As the concept talks, atoms of components revealed to x-rays become thrilled and produce power. The power produced by an thrilled atom is exclusive. Consequently, this technique is an efficient way of determining what components are existing in a content. X-ray flourescence does not only identify what components are existing but also decides how much of each factor is existing.

Much of good content recognition analyze is done with the use of x-ray flourescence, which is appropriate when the reliability of the content being examined should be maintained. Some content research need getting a item of the analyze topic for clinical research but this is not appropriate in many circumstances. Positive content recognition is just one of the many nondestructive examining techniques, like sound exhaust, flow recognition, and hydrotesting.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:   (315) 736-5480      
Fax: (315) 736-9321

For further information,

please contact:

Deborah Delluomo

Phone:            (315) 736-5480       ext. 2202

http://www.orslabs.com

 

 

Permalink | Leave a comment  »

]]>
http://posterous.com/images/profile/missing-user-75.png http://posterous.com/users/n4Km2svts4790 orslabs orslabs orslabs