orslabs's Space http://orslabs.posterous.com Most recent posts at orslabs's Space posterous.com Mon, 18 Mar 2013 02:30:00 -0700 Microelectronic Industry And Analytical Testing Services http://orslabs.posterous.com/microelectronic-industry-and-analytical-testi http://orslabs.posterous.com/microelectronic-industry-and-analytical-testi

In present scenario, where computers, electronics and various optical devices including light-emitting diodes, lasers and solar panels are already developed sectors and most significant areas of technology, the microelectronic market is also growing at a very fast pace. With the boom in this market, the need for highly functional microelectronic products is increasing rapidly. This increasing demand of these products has ultimately augmented their production which eventually raised the requirement of analytical testing services for these products.

Manufacturing of microelectronic products is not an easy task and hence their fabrication involves complex procedure including superior quality material, sophisticated tools and equipment, quality testing and other related steps. The microelectronic industry is dealing with a discouraging task of managing and co-integrating an unparalleled convergence of pioneering approaches. As a result of the introduction of these pioneering approaches and new material created a new set of diverse and simultaneous difficulties for both, unit process development and process assimilation.

Testing services for microeconomic components involves a thorough check on each and every stage of production and well as its practices. This not only involves manufacturing testing but, material testing is the other major aspect which is tested while producing these components. Various tools and equipments are widely used for advanced measuring instrumental analysis which can work at smaller metrics to control quality of the components in a better way. Electron Microscopy is among such important tools which are used for testing these components.

Electron Microscopy system of testing is widely used to test the characteristics of micro and nano component features. Various material related problems come across during research and development including production engineering, reliability testing for failure analysis and engineering can be easily solved by using Electron Microscopy. There are two types of essential electron microscopy methods which are used for testing material for microelectronic products i.e. Transmission Electron Microscopy and Scanning Electron Microscopy (SEM).

If you are also looking for analytical testing services, then you can find them online. There are a huge number of companies offering these services. All you need to do is to type a related keyword in any popular search engine, then you will get all the best results displayed before you among which you can choose the one that fits all your needs. Some prominent testing companies are expert in various testing tasks including construction analysis, chemical analysis, destructive physical analysis, failure analysis, Scanning Acoustic Microscopy and Real Time X-Ray Inspection.

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Mon, 13 Aug 2012 22:02:00 -0700 Why Surface Analysis is important? http://orslabs.posterous.com/why-surface-analysis-is-important http://orslabs.posterous.com/why-surface-analysis-is-important home

Surface Analysis Techniques:

Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional groups of small spot size organic contaminants found on surfaces.

Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In combination with Argon milling, an elemental profile of the surface can be plotted, determining variations in elemental compositions with depth.

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Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)

About Author:

ORS Labs offers a wide range of analytical techniques for material evaluation, process monitoring and failure analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs, metals, gases, organics and inorganics. Our scientific staff will recommend the analytical technique that will best meet your requirements.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo)
Fax: (315) 736-9321

http://www.orslabs.com

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Tue, 07 Aug 2012 02:16:00 -0700 Why does u need Analytical Testing Services? http://orslabs.posterous.com/why-does-u-need-analytical-testing-services http://orslabs.posterous.com/why-does-u-need-analytical-testing-services home

MATERIALS AND COMPONENT SERVICES OVERVIEW

ORS offers a variety of analytical services to assist you in the Quality Control, Process Monitoring, Failure Investigation or Research & Development of your products. Our goal is to provide you with analytical tools to aid in maintaining and improving the quality of your products.

Testing Services for the Microelectronic Industry
A comprehensive suite of tests evaluating the quality and integrity of microelectronic components and manufacturing practices.

Internal Vapor Analysis (IVA™)
Internal Vapor Analysis (IVA™) is a versatile and precise test procedure developed at ORS for the Residual Gas Analysis (RGA) of hermetic packages. The IVA™ method utilizes advanced Mass Spectrometry techniques to accurately determine the relative concentrations of gas or vapor content in hermetic devices, modules, packages, and inclusions.

Internal Vapor Analysis (IVA™) may now be performed by Gas Chromatography with Mass Spectrometry (GC/MS) to identify unknown volatile and semi-volatile organics in hermetic devices, modules, and packages. ORS has developed a procedure to determine relative concentrations of gases in these packages using a modified GC sample inlet designed at ORS. The GC/MS procedure allows positive identification of unknown organics not traditionally identified during RGA analysis. This procedure is an excellent complement to RGA for a “complete picture” of internal vapors.

Hermeticity Testing
ORS offers two types of non-destructive hermeticity testing. Test methods are designed to determine the quality of a hermetic seal. Fine leak rates are quantified using a helium mass spectrometer or a Kr85 Scintillation Detector. Gross leak rates are characterized by perflourocarbons, dye pentrants or devices failing the initial Kr85 gross leak pressurization. Specialized testing capabilities to measure the leak rate of various other gases or compounds (i.e. Argon, Acetic Acid, etc.) are also available.

Materials Outgassing Studies
The Material Outgassing Characterization test, developed at ORS, is a qualitative and quantitative analysis of the off-gassed gaseous substances desorbed from bulk materials. Outgassing studies may be useful in determining hydrogen desorption rates, adhesive outgassing species (pre and post cure), and to characterize other organic bulk materials used in high reliability components, including polymers, coatings, and epoxies. This method can even be modified to identify organic contamination on materials.

Organic Mass Spectrometry
Numerous techniques are available to identify volatile and semi-volatile organic compounds, and impurities from a variety of sample matrices. Sensitivity in the ppb range is commonly obtained. A useful technique to identify low level "unknown" organic compounds in IVA™ data.

Construction Analysis
Typically performed on microelectronic devices to determine or evaluate the inherent design and robustness of a component by examining its physical characteristics and quality of workmanship.

Destructive Physical Analysis
Disassembly, testing and inspection of microelectronic devices to determine conformance with applicable design, process and procurement requirements.

Failure Analysis
A comprehensive examination of failed devices or components to verify a reported failure mode, identify the failure mechanism, and recommend corrective actions.

About Us:

Oneida Research Services® (ORS) offers specialized laboratory testing services to support the microelectronics, Tele-communications, aerospace, medical, and defense industries. Our services focus on research, development and quality control of our client's products exclusively for our client. ORS strives to develop long term relationships with our clients through unwavering professionalism, flexibility and attention to detail.

Address:

8282 Halsey Road
Whitesboro, NY 13492
Phone:  (315) 736-5480 ext. 2202   (Deborah Delluomo) 

Fax: (315) 736-9321
http://www.orslabs.com

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